Qui, 02/03/2023 - 10:30 - 12:00
Tipo de evento:
Seminário
Organizador:
SYNERGY Project
Localização específica:
UNINOVA auditorium
2nd March, 10.30am, at UNINOVA auditorium, we have the pleasure to host a short technical seminar by Sylvia Conzendorf, titled "Microelectronic materials and nanoanalysis".
The presentation will cover a range of nanoanalysis tools, namely the Helios 5 PFIB CXe DualBeam tool and its sample preparation capabilities for slice and view, transmission electron microscope and nano-XCT. Furthermore an overview of the In-situ tools for the Zeiss NVision 40 will be presented and a brief insight of the TEM and nXCT will be given, being all these techniques available at Fraunhofer IKTS.
Sylvia Conzendorf is working at Fraunhofer IKTS (Dresden), partner in the Synergy EU project (
https://synergyproject.eu), coordinated by UNINOVA-CEMOP, and she is a specialist in SEM/FIB.
