Jonas Deuermeier holds a joint doctoral degree from the Universidade Nova de Lisboa, Portugal and the Technische Universität Darmstadt, Germany as a result of a collaborative PhD project under co-supervision by Prof. Elvira Fortunato and Prof. Andreas Klein. He has profound methodological experience on in situ and ex situ X-ray photoelectron spectroscopy (XPS). His work in this field contributed to expand the possibilities of this powerful analytic tool by developing novel experimental approaches, such as the combination with parallel in situ electrical characterization and the usage of the Auger parameter for the determination of energy band alignments at the nanoscale. Currently, he is responsible for the XPS equipment at i3N/CENIMAT. His research is focused on the development of novel optoelectronic devices with built-in potential, such as rectifying resistive switching memdiodes.
Material Science, Oxide Semiconductors, Surface Science, Optoelectronics, Nanotechnology